3D Scanning Fluorescence Spectrophotometer – GAOTek

Description Features         High sensitivity with SNR > 200         Fast scanning at 48,000nm/min         Wide range: 200-900nm spectrum         Dual-beam excitation monitoring system         High-quality Hamamatsu xenon lamp         Quick 3D fluorescence scanning         Built-in optical gate for stability         Ideal for diverse analytical fields   Technical Specifications Categories Details Excitation Source 150 W Xenon Lamp Excitation Wavelength 200 nm to 900 nm Emission Wavelength 200 nm to 900 nm Excitation Slit SP-LF 97 X/SP-LF 97 P: 2 nm, 5 nm, 10 nm, 20 nm; SP-LF 97: 10nm Emission Slit SP-LF 97 X/SP-LF 97 P: 2 nm, 5 nm, 10 nm, 20 nm; SP-LF 97: 10 nm Wavelength Accuracy SP-LF 97 X: ±0.4 nm; SP-LF 97/SP-LF97P: ±1.0 nm Wavelength Repeatability SP-LF 97 X: ≤0.2 nm; SP-LF 97/SP-LF97P: ≤0.5 nm Signal to Noise Ratio SP-LF97X: S/N ≥200 (P-P), ≥1200 (RMS), ≥12000 (RMSBG) SP-LF 97/SP-LF 97P: S/N ≥150 (P-P), ≥1000 (RMS), ≥10000 (RMSBG) Detection Limit SP-LF 97X: ≤5×10⁻¹¹ g/ml; SP-LF 97/SP-LF 97P: ≤1×10⁻¹⁰ g/ml Linearity γ ≥0.995 Peak Repeatability ≤1.5% Stability (10 min) Zero Drift: ±0.3; Value Limit: ±1.5% Wavelength Scan Speed Multi-speed level, maximum at 48000 nm/min Photometric Quantity Range 0.00 to 10000.00 Data Transmission USB 2.0 Power 200 W Power Source 110 to 240 VAC, 50/60 Hz Weight 26.46 lbs (12 kg) Instrument Dimension 14.96 in ×17.52 in ×12.20 in (380 mm × 445 mm × 310 mm)